Abstract: The problems associated with the traditional layered protocol conformance testing method include repetitive and incomplete testing when confronted with the cross-layer stack architecture and hybrid topology of the WIA-PA communication standards. We propose a new WIA-PA conformance testing method based on the Petri-net model for device life cycles. The Petri-net model was established to cover the entire device life cycle, from the time of configuration, to operation, and decommissioning. We analyze its dynamic features using a coverability graph, and then extract the WIA-PA test suites. We also design and develop a WIA-PA conformance test platform, and verify the efficiency of the proposed method by comparing its results with those of the traditional layered conformance testing method.