WIA-PA Protocol Conformance Testing Method Based on Petri Net Model for Device Life Cycle

The problems associated with the traditional layered protocol conformance testing method include repetitive and incomplete testing when confronted with the cross-layer stack architecture and hybrid topology of the WIA-PA communication standards. We propose a new WIA-PA conformance testing method based on the Petri-net model for device life cycles. The Petri-net model was established to cover the entire device life cycle, from the time of configuration, to operation, and decommissioning. We analyze its dynamic features using a coverability graph, and then extract the WIA-PA test suites. We also design and develop a WIA-PA conformance test platform, and verify the efficiency of the proposed method by comparing its results with those of the traditional layered conformance testing method.