Reliability Estimation for the Generalized Exponential Components in Parallel System Using Masked Data

The reliability estimation for generalized exponential components in the parallel system whose life data contains some masked data are discussed.The maximum likelihood estimations and Bayes estimations of the components' unknown parameters and reliability functions are given by using maximum likelihood method and Bayes theory.Finally,random simulations are introduced to compare these two estimations and study the influence of sample size and masking level on the accuracy of the estimations.