A Feature Selection Method in Pattern Recognition

In this paper,a new feature selection method in a two-class pattern recognition problem is presented.It is based on a qualified subset of the sample and is suitableto pattern classification in comparison with some other methods,such as K-L feature selection,minimum intraset Euclidean distance feature selection,maximum intraset Euclidean distance feature selection.The latter two methods were suggested in 〔1〕.